Product Information

NUP4302MR6T1G

NUP4302MR6T1G electronic component of ON Semiconductor

Datasheet
ON Semiconductor Schottky Diodes & Rectifiers Schottky Array for 5 Data Line ESD

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

3000: USD 0.5261 ea
Line Total: USD 1578.3

162960 - Global Stock
Ships to you between
Fri. 03 May to Thu. 09 May
MOQ: 3000  Multiples: 3000
Pack Size: 3000
Availability Price Quantity
1149 - Global Stock


Ships to you between Fri. 03 May to Thu. 09 May

MOQ : 13
Multiples : 1

Stock Image

NUP4302MR6T1G
ON Semiconductor

13 : USD 0.7038
25 : USD 0.6618
100 : USD 0.5966
250 : USD 0.5848

162960 - Global Stock


Ships to you between Fri. 03 May to Thu. 09 May

MOQ : 3000
Multiples : 3000

Stock Image

NUP4302MR6T1G
ON Semiconductor

3000 : USD 0.5261

     
Manufacturer
Product Category
RoHS - XON
Icon ROHS
Product
Mounting Style
Package / Case
Configuration
Technology
If - Forward Current
Vrrm - Repetitive Reverse Voltage
Vf - Forward Voltage
Ir - Reverse Current
trr - Reverse Recovery time
Pd - Power Dissipation
Minimum Operating Temperature
Maximum Operating Temperature
Series
Packaging
Brand
Forward Continuous Current
Recovery Time
Forward Voltage Drop
Maximum Reverse Leakage Current
Peak Reverse Voltage
Factory Pack Quantity :
Height
Length
Operating Temperature Range
Termination Style
Type
Width
Cnhts
Hts Code
Mxhts
Product Type
Subcategory
Taric
Brand Category
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NUP4302MR6 Schottky Diode Array for Four Data Line ESD Protection The NUP4302MR6 is designed to protect high speed data line interface from ESD, EFT and lighting. NUP4302MR6 MAXIMUM RATINGS (T = 25C unless otherwise noted) J Rating Symbol Value Unit Peak Reverse Breakdown Voltage V 30 V BR Forward Power Dissipation (T = 25C) P 225 mW A F Forward Continuous Current I 200 mA F Junction Operating Temperature T 55 to +125 C J Storage Temperature Range T 55 to +150 C stg Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. ELECTRICAL CHARACTERISTICS (T = 25C unless otherwise noted) J Parameter Symbol Conditions Min Typ Max Unit Reverse Breakdown Voltage V I = 100 A 30 V BR R Reverse Leakage I V = 25 V 30 A R R Forward Voltage V I = 0.1 mAdc 0.28 V F F Forward Voltage V I = 1.0 mAdc 0.35 V F F Forward Voltage V I = 10 mAdc 0.45 V F F Forward Voltage V I = 100 mAdc 1.00 V F F Total Capacitance C V = 0 V, f = 1.0 MHz, I/O to Ground 28 pF T R V = 0 V, f = 1.0 MHz, I/O to I/O 18 R Reverse Recovery Time t I = I = 10 mA, I = 1.0 mA (Figure 1) 5.0 ns rr F R R(REC) 820 +10 V 2 k 0.1 F I F t t t I r p F 100 H t t 0.1 F 10% rr DUT 90% 50 OUTPUT 50 INPUT i = 1 mA PULSE SAMPLING R(REC) I R GENERATOR OSCILLOSCOPE V R OUTPUT PULSE INPUT SIGNAL (I = I = 10 mA measured F R at i = 1 mA) R(REC) Notes: 1. A 2.0 k variable resistor adjusted for a Forward Current (I ) of 10 mA. F Notes: 2. Input pulse is adjusted so I is equal to 10 mA. R(peak) Notes: 3. t t p rr Figure 1. Recovery Time Equivalent Test Circuit

Tariff Desc

8541.10.00 15 No - Diodes, other than photosensitive or light emitting diodes Free
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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