Product Information

CAV24C32C4CTR

CAV24C32C4CTR electronic component of ON Semiconductor

Datasheet
EEPROM 32KB I2C SER EEPROM

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

1: USD 1.1656 ea
Line Total: USD 1.17

9700 - Global Stock
Ships to you between
Mon. 03 Jun to Wed. 05 Jun
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
8283 - WHS 1


Ships to you between Mon. 03 Jun to Wed. 05 Jun

MOQ : 1
Multiples : 1

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CAV24C32C4CTR
ON Semiconductor

1 : USD 0.2691
10 : USD 0.2657
100 : USD 0.2242
500 : USD 0.222
1000 : USD 0.215
5000 : USD 0.2059
10000 : USD 0.1943
25000 : USD 0.1909
50000 : USD 0.1806

     
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CAV24C32 2 EEPROM Serial 32-Kb I C - Automotive Grade 1 Description 2 The CAV24C32 is a EEPROM Serial 32Kb I C devices, internally organized as 4096 words of 8 bits each. www.onsemi.com It features a 32byte page write buffer and supports the Standard 2 (100 kHz) and Fast (400 kHz) I C protocol. External address pins make it possible to address up to eight CAV24C32 devices on the same bus. WLCSP5 WLCSP4 SOIC8 C5A SUFFIX C4C SUFFIX W SUFFIX Features CASE 567JQ CASE 567JY CASE 751BD Automotive AECQ100 Grade 1 (40C to +125C) Qualified 2 TSSOP8 Supports Standard and Fast I C Protocol Y SUFFIX 2.5 V to 5.5 V Supply Voltage Range CASE 948AL 32Byte Page Write Buffer Hardware Write Protection for Entire Memory PIN CONFIGURATIONS (Top Views) CAV Prefix for Automotive and Other Applications Requiring Site 132 and Change Control 2 1 2 Schmitt Triggers and Noise Suppression Filters on I C Bus Inputs A (SCL and SDA) V V A CC SS V V CC SS Low Power CMOS Technology B 1,000,000 Program/Erase Cycles SDA SCL SDA B 100 Year Data Retention C SOIC, TSSOP 8lead, and WLCSP 4Ball and 5Ball Packages WP SCL WLCSP4 (C4C) This Device is PbFree, Halogen Free/BFR Free, and RoHS WLCSP5 (C5A) Compliant 1 A V 0 CC V CC A WP 1 SCL A 2 SCL V SDA SS SOIC (W), TSSOP (Y) CAV24C32 SDA A , A , A 2 1 0 For the location of Pin 1, please consult the corresponding package drawing. WP PIN FUNCTION Pin Name Function V SS A0, A1, A2 Device Address Input Figure 1. Functional Symbol SDA Serial Data Input/Output SCL Serial Clock Input WP Write Protect Input V Power Supply CC V Ground SS This document contains information on some products that are still under development. ORDERING INFORMATION ON Semiconductor reserves the right to change or discontinue these products without notice. See detailed ordering and shipping information in the package dimensions section on page 8 of this data sheet. Semiconductor Components Industries, LLC, 2017 1 Publication Order Number: April, 2019 Rev. 5 CAV24C32/DCAV24C32 DEVICE MARKINGS (TSSOP8) (SOIC8) C32F 24C32F AYMXXX AYMXXX C32F = Specific Device Code A = Assembly Location Y = Production Year (Last Digit) 24C32F = Specific Device Code M = Production Month (1-9, O, N, D) A = Assembly Location XXX = Last Three Digits of Assembly Lot Number Y = Production Year (Last Digit) = PbFree Package M = Production Month (1-9, O, N, D) XXX = Last Three Digits of Assembly Lot Number = PbFree Package (WLCSP5) (WLCSP4) 2 B YW YW 2 = Specific Device Code B = Specific Device Code Y = Production Year Code Y = Production Year Code W = Production Workweek Code W = Production Workweek Code Table 1. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Storage Temperature 65 to +150 C Voltage on any Pin with Respect to Ground (Note 1) 0.5 to +6.5 V Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. During input transitions, voltage undershoot on any pin should not exceed 1 V for more than 20 ns. Voltage overshoot on pins A , A , A 0 1 2 2 and WP should not exceed V + 1 V for more than 20 ns, while voltage on the I C bus pins, SCL and SDA, should not exceed the absolute CC maximum ratings, irrespective of V . CC Table 2. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units N (Note 3) Endurance 1,000,000 Program/Erase Cycles END T Data Retention 100 Years DR 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100 and JEDEC test methods. 3. Page Mode, V = 5 V, 25C. CC Table 3. D.C. OPERATING CHARACTERISTICS (V = 2.5 V to 5.5 V, T = 40C to +125C, unless otherwise specied.) CC A Symbol Parameter Test Conditions Min Max Units I Read Current Read, f = 400 kHz 1 mA CCR SCL I Write Current Write, f = 400 kHz 2 mA CCW SCL I Standby Current All I/O Pins at GND or V T = 40C to +125C 5 A SB CC A I I/O Pin Leakage Pin at GND or V 2 A L CC V Input Low Voltage 0.5 0.3 x V V IL CC V Input High Voltage A , A , A and WP 0.7 x V V + 0.5 V IH 0 1 2 CC CC SCL and SDA 0.7 x V 5.5 CC V Output Low Voltage V > 2.5 V, I = 3 mA 0.4 V OL CC OL Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. www.onsemi.com 2

Tariff Desc

8542.32.00 32 No ..CMOS and MOS Read Only Memory and Programmable Read Only Memory whether erasable or non-erasable (for example, flash memory, EPROM, E2PROM, EAPROM, NOVRAM, ROM and PROM)
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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