NFZ32BW520HN11L

Reference Only SpecNo.JENF243J-0003D-01 P1/8 CHIP NOISE FILTER NFZ32BWHN11L REFERENCE SPECIFICATION 1. Scope This reference specification applies to NFZ32BW HN11L Series, Chip Noise Filter. 2. Part Numbering (ex) NF Z 32 BW 1R0 H N 1 1 L Product ID Structure Dimension Features Impedance Performance Category Numbers Other Packaging (LW) of Circuit L:Taping 3. Rating Operating Temperature Range. (Ambient temperature Self-temperature rise is not included) -40 to +105C (Product temperature Self- temperature rise is included) -40 to +125C Storage Temperature Range. -40 to +125C Impedance DC Resistance 1 Rated Current(mA) at 1MHz Customer MURATA 2 Ambient 3 Ambient Part Number Part Number () Tolerance () Tolerance temperature temperature 85 105 NFZ32BW3R3HN11L3.3 0.024 2900 1490 NFZ32BW6R8HN11L6.8 0.036 2500 1380 NFZ32BW8R4HN11L8.4 0.048 2400 1360 NFZ32BW9R8HN11L9.8 0.053 2100 1110 NFZ32BW120HN11L12 0.064 1850 910 NFZ32BW190HN11L19 0.089 1800 900 30% 20% NFZ32BW210HN11L21 0.100 1550 800 NFZ32BW310HN11L31 0.155 1200 610 NFZ32BW520HN11L52 0.220 1100 550 NFZ32BW650HN11L65 0.295 900 450 NFZ32BW101HN11L100 0.475 900 330 NFZ32BW151HN11L150 0.685 700 270 1As for the rated current, rated current derated as figure.1 depending on the operating temperature. 2When applied rated current to the Products, temperature rise caused by self heating will be 40C or less. 3When applied rated current to the Products, temperature rise caused by self heating will be 20C or less. Fugure. 1 Rated Current at 85 Rated Current at 105 85 105 Operating Temperature (Ambient temperature) 4. Testing Conditions Unless otherwise specified In case of doubt Temperature : Ordinary Temperature (15 to 35C) Temperature : 20 2C Humidity : Ordinary Humidity (25 to 85 % (RH)) Humidity : 60 to 70 % (RH) Atmospheric Pressure : 86 to 106 kPa MURATA MFG.CO., LTD Rated Current mA Reference Only SpecNo.JENF243J-0003D-01 P2/8 5. Appearance and Dimensions 2.70.2 2.50.2 2.50.2 2.8 3.20.3 Unit Mass (Typical value) 0.044 No marking. ( mm) (in mm) 0.90.3 0.90.3 1.30.2 6. Electrical Performance No. Item Specification Test Method 6.1 Impedance Impedance shall meet item 3. Measuring EquipmentKEYSIGHT 4192A or equivalent Measuring Frequency1MHz 6.2 DC Resistance DC Resistance shall meet item 3. Measuring EquipmentDigital multi meter 7. Mechanical Performance No. Item Specification Test Method 7.1 Shear Test Chip coil shall not be damaged. SubstrateGlass-epoxy substrate Chip Coil Force10N Hold Duration51s Substrate 7.2 Bending Test SubstrateGlass-epoxy substrate (100401.0mm) Speed of Applying Force0.5mm / s Deflection2mm Hold Duration5s Pressure jig R230 F Deflection 45 45 Product (in mm) 7.3 Vibration Chip Noise Filter shall not be Oscillation Frequency10 to 2000 to 10Hz for 20 min damaged. Total amplitude1.5 mm or Acceleration amplitude 2 98 m/s whichever is smaller. Testing TimeA period of 2 hours in each of 3 mutually perpendicular directions. (Total 6 hours) MURATA MFG.CO., LTD 1.550.15