Reference Only SpecNo.JENF243J-0004B-01 P1/8 CHIP NOISE FILTER NFZ32BW HN10L REFERENCE SPECIFICATION 1.Scope This reference specification applies to NFZ32BW HN10L Series, Chip Noise Filter. 2.Part Numbering (ex) NF Z 32 BW 3R6 H N 1 0 L Product ID Structure Dimension Features Impedance Performance Category Numbers Other Packaging (LW) of Circuit L:Taping 3.Rating Operating Temperature Range. (Ambient temperature Self-temperature rise is not included) -40 to +105C (Product temperature Self- temperature rise is included) -40 to +125C Storage Temperature Range. -40 to +125C 1 Rated Current(mA) Impedance at 1MHz DC Resistance 2 Ambient 3 Ambient Customer Part Number MURATA Part Number temperature temperature () Tolerance () Tolerance 85 105 NFZ32BW3R6HN10L3.6 0.030 2550 1600 NFZ32BW7R4HN10L7.4 0.045 2050 1320 NFZ32BW9R0HN10L9.0 0.057 1750 1010 NFZ32BW150HN10L15 0.076 1600 970 NFZ32BW210HN10L21 0.12 1200 670 NFZ32BW320HN10L32 0.18 1000 530 NFZ32BW420HN10L42 0.24 850 510 NFZ32BW700HN10L70 30% 0.38 20% 700 380 NFZ32BW111HN10L110 0.57 520 320 NFZ32BW151HN10L150 0.81 450 240 NFZ32BW221HN10L220 1.15 390 190 NFZ32BW291HN10L290 1.78 310 140 NFZ32BW451HN10L450 2.28 275 120 NFZ32BW621HN10L620 2.70 250 110 NFZ32BW881HN10L880 4.38 200 80 1: As for the rated current, rated current derated as figure.1 depending on the operating temperature. 2: When applied rated current to the Products, temperature rise caused by self heating will be 40C or less. 3: When applied rated current to the Products, temperature rise caused by self heating will be 20C or less. Fugure. 1 Rated Current at 85 Rated Current at 105 85 105 Operating Temperature (Ambient temperature) MURATA MFG.CO., LTD Rated Current mA Reference Only SpecNo.JENF243J-0004B-01 P2/8 4. Testing Conditions Unless otherwise specified In case of doubt Temperature : Ordinary Temperature (15 to 35C) Temperature : 20 2C Humidity : Ordinary Humidity (25 to 85 %(RH)) Humidity : 60 to 70%(RH) Atmospheric Pressure : 86 to 106 kPa 5.Appearance and Dimensions 2.70.2 2.50.2 2.50.2 2.8 3.20.3 Unit MassTypical value No marking. 0.044 ( mm) (in mm) 0.90.3 1.30.2 0.90.3 6.Electrical Performance No. Item Specification Test Method 6.1 Impedance Impedance shall meet item 3. Measuring Equipment : KEYSIGHT 4192A or equivalent Measuring Frequency: 1MHz 6.2 DC Resistance DC Resistance shall meet item 3. Measuring Equipment: Digital multi meter 7.Mechanical Performance No. Item Specification Test Method 7.1 Shear Test Chip Noise Filter shall not be Substrate: Glass-epoxy substrate damaged. Force: 10N Hold Duration: 51sChip Coil Substrate 7.2 Bending Test Substrate: Glass-epoxy substrate (100401.0mm) Speed of Applying Force: 0.5mm / s Deflection: 2mm Hold Duration: 5s Pressure jig R230 F Deflection 45 45 Product (in mm) 7.3 Vibration Chip Noise Filter shall not be Oscillation Frequency : 10 to 2000 to 10Hz for 20 min damaged. Total amplitude : 1.5 mm or Acceleration amplitude 2 98 m/s whichever is smaller. Testing Time: A period of 2 hours in each of 3 mutually perpendicular directions. (Total 6 hours) MURATA MFG.CO., LTD 1.550.15