Product Information

NCV4274AST25T3G

NCV4274AST25T3G electronic component of ON Semiconductor

Datasheet
Linear Voltage Regulator IC Positive Fixed 1 Output 400mA SOT-223 (TO-261)

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)
N/A

Obsolete
Availability Price Quantity
0 - WHS 1

MOQ : 4000
Multiples : 4000

Stock Image

NCV4274AST25T3G
ON Semiconductor

4000 : USD 0.7684
N/A

Obsolete
0 - WHS 2

MOQ : 1
Multiples : 1

Stock Image

NCV4274AST25T3G
ON Semiconductor

1 : USD 1.8687
10 : USD 1.6675
100 : USD 1.3003
500 : USD 1.0741
1000 : USD 0.848
N/A

Obsolete
0 - WHS 3


Multiples : 1

Stock Image

NCV4274AST25T3G
ON Semiconductor

N/A

Obsolete
     
Manufacturer
Product Category
Mounting Style
Package / Case
Output Voltage
Output Current
Number of Outputs
Input Voltage MIN
Input Voltage MAX
Output Type
Minimum Operating Temperature
Maximum Operating Temperature
Dropout Voltage
Series
Packaging
Brand
Output Voltage Range
Voltage Regulation Accuracy
Ib - Input Bias Current
Line Regulation
Load Regulation
Factory Pack Quantity :
Rohs Mouser
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NCV4274, NCV4274A Regulator Family, 400 mA, 2% and 4% Voltage Description The NCV4274 and NCV4274A is a precision micropower voltage regulator with an output current capability of 400 mA available in the www.onsemi.com DPAK, D2PAK and SOT223 packages. The output voltage is accurate within 2.0% or 4.0% depending on MARKING DIAGRAMS the version with a maximum dropout voltage of 0.5 V with an input up to 40 V. Low quiescent current is a feature drawing only 150 A with a 4 1 mA load. This part is ideal for automotive and all battery operated microprocessor equipment. 74XxxG 1 Input ALYWW The regulator is protected against reverse battery, short circuit, and 2, 4 Ground x DPAK thermal overload conditions. The device can withstand load dump 3 Output DT SUFFIX transients making it suitable for use in automotive environments. 2 CASE 369C 1 3 Features 2.5, 3.3 V, 5.0 V, 8.5 V, 2.0% Output Options 4 2.5, 3.3 V, 5.0 V, 4.0% Output Options Low 150 A Quiescent Current at 1 mA load current 1 Input NC 400 mA Output Current Capability 2, 4 Ground V4274Xxx 3 Output Fault Protection AWLYWWG D2PAK +60 V Peak Transient Voltage with Respect to GND DS SUFFIX 42 V Reverse Voltage CASE 418AF Short Circuit 123 Thermal Overload 4 Very Low Dropout Voltage NCV Prefix for Automotive and Other Applications Requiring AYW 1 Input Unique Site and Control Change Requirements AECQ100 74Xxx 2, 4 Ground Qualified and PPAP Capable SOT223 3 Output ST SUFFIX These are PbFree Devices CASE 318E 1 23 X = A or blank xx = Voltage Ratings A = Assembly Location L, WL = Wafer Lot Y = Year WW, W = Work Week G, = PbFree Package (Note: Microdot may be in either location) ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 15 of this data sheet. Semiconductor Components Industries, LLC, 2013 1 Publication Order Number: November, 2018 Rev. 16 NCV4274/DNCV4274, NCV4274A I Q Bandgap Current Limit and Saturation Sense Refernece + Thermal Shutdown GND Figure 1. Block Diagram Pin Definitions and Functions Pin No. Symbol Function 1 I Input Bypass directly at the IC a ceramic capacitor to GND. 2,4 GND Ground 3 Q Output Bypass with a capacitor to GND. 1. DPAK 3LD package code 6025 2. D2PAK 3LD package code 6083 ABSOLUTE MAXIMUM RATINGS Pin Symbol, Parameter Symbol Condition Min Max Unit I, InputtoRegulator Voltage V 42 45 V I Current I Internally Internally I Limited Limited I, Input peak Transient Voltage to Regulator with Respect V 60 V I to GND Q, Regulated Output Voltage V 1.0 40 V V = V Q Q I Current I Internally Internally Q Limited Limited GND, Ground Current I 100 mA GND Junction Temperature T 150 C J Storage Temperature T 50 150 C Stg ESD Capability, Human Body Model ESD 4 kV HB ESD Capability, Machine Model ESD 200 V MM ESD Capability, Charged Device Model ESD 1 kV CDM Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 3. This device series incorporates ESD protection and is tested by the following methods: ESD HBM tested per AECQ100002 (EIA/JESD22A114) ESD MM tested per AECQ100003 (EIA/JESD22A115) ESD CDM tested per EIA/JES D22/C101, Field Induced Charge Model www.onsemi.com 2

Tariff Desc

8542.31.00 51 No ..Application Specific (Digital) Integrated Circuits (ASIC)

Electronic integrated circuits: Processors and controllers, whether or not combined with memories, converters, logic circuits, amplifiers, clock and timing circuits, or other circuits
Monolithic integrated circuits:
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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