Product Information

NCP4589DSQ12T1G

NCP4589DSQ12T1G electronic component of ON Semiconductor

Datasheet
LDO Voltage Regulators 300 MA, 3-MODE LDO
Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

295: USD 0.425 ea
Line Total: USD 125.38

1419 - Global Stock
Ships to you between
Fri. 31 May to Wed. 05 Jun
MOQ: 295  Multiples: 1
Pack Size: 1

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1419 - WHS 1


Ships to you between
Fri. 31 May to Wed. 05 Jun

MOQ : 295
Multiples : 1

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NCP4589DSQ12T1G
ON Semiconductor

295 : USD 0.425

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Additional Infomation About Product

NCP4589 300 mA, Tri-Mode, LDO Linear Voltage Regulator The NCP4589 is a CMOS 300 mA LDO which switches to a low power mode under light current loads. The device automatically switches back to a fast response mode as the output load increases NCP4589 AE AE Vin Vout Vin Vout Vref Vref Current Limit Current Limit CE CE GND GND NCP4589Dxxxx NCP4589Hxxxx Figure 2. Simplified Schematic Block Diagram PIN FUNCTION DESCRIPTION Pin No. Pin No. Pin No. XDFN SC 70 SOT23 Pin Name Description 4 4 1 VIN Input pin 2 2 2 GND Ground 3 5 3 CE Chip enable pin 6 3 5 VOUT Output pin 1 1 4 AE Auto Eco Pin 5 NC No connection ABSOLUTE MAXIMUM RATINGS Rating Symbol Value Unit Input Voltage (Note 1) V 6.0 V IN Output Voltage VOUT 0.3 to VIN + 0.3 V Chip Enable Input VCE 0.3 to 6.0 V Auto Eco Input V 0.3 to 6.0 V AE Output Current I 400 mA OUT P mW Power Dissipation XDFN 400 D Power Dissipation SC70 380 Power Dissipation SOT23 420 Junction Temperature T 40 to 150 C J Storage Temperature T 55 to 125 C STG Operation Temperature T 40 to 85 C A ESD Capability, Human Body Model (Note 2) ESD 2000 V HBM ESD Capability, Machine Model (Note 2) ESD 200 V M M Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. Refer to ELECTRICAL CHARACTERISTIS and APPLICATION INFORMATION for Safe Operating Area. 2. This device series incorporates ESD protection and is tested by the following methods: ESD Human Body Model tested per AECQ100002 (EIA/JESD22A114) ESD Machine Model tested per AECQ100003 (EIA/JESD22A115) Latchup Current Maximum Rating tested per JEDEC standard: JESD78.

HS Compliance

Tariff Desc

8542.31.00 51 No ..Application Specific (Digital) Integrated Circuits (ASIC)

Electronic integrated circuits: Processors and controllers, whether or not combined with memories, converters, logic circuits, amplifiers, clock and timing circuits, or other circuits
Monolithic integrated circuits:

ON Semiconductor may also be referenced as

Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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