Product Information

NCP1615GEVB

NCP1615GEVB electronic component of ON Semiconductor

Datasheet
ON Semiconductor Power Management IC Development Tools NCP1615 EVAL BD

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

1: USD 127.2798 ea
Line Total: USD 127.28

0 - Global Stock
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
0 - WHS 1


Ships to you between Tue. 07 May to Mon. 13 May

MOQ : 1
Multiples : 1

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NCP1615GEVB
ON Semiconductor

1 : USD 127.2798

0 - WHS 2


Ships to you between Mon. 13 May to Wed. 15 May

MOQ : 1
Multiples : 1

Stock Image

NCP1615GEVB
ON Semiconductor

1 : USD 128.2969

     
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Tool Is For Evaluation Of
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Test Procedure for the NCP1615GEVB Evaluation Board Table 1: Required Equipment *Chroma 61604 AC *Voltech PM3000A *Agilent 34401A Power Source Power Analyzer Multimeter *Chroma 6314 *Tektronix TDS5034B *Agilent 34401A Electronic Load with Oscilloscope with Multimeter *Chroma 63108 High *Tektronix P5205 Voltage Module Differential Probes *Equivalent test equipment may be substituted. Test Procedure: 1. Make sure jumper J4 (PSM) is connected. 2. Connect the electronic load with high voltage module to the output labeled 400 V/ 300 mA. 3. Connect one of the multimeters in series with the output and load and set it to measure current. 4. Connect the second multimeter to the output and set it to measure voltage. 5. Connect the oscilloscope with differential probes to the output and set it to measure output ripple and frequency. 6. Connect the ac power source and power analyzer to the terminals labeled Input. Set the current compliance limit to 3 A. 7. Set the ac power source to 85 Vac / 60 Hz. 8. Set the high voltage electronic load to 300 mA. 9. Turn the AC source on. 10. Wait 10 seconds, and then check the output voltage (V ) using the corresponding OUT multimeter. Verify it is within the limits of Table 2. 11. Measure power factor (PF) and input power (P ) using the power analyzer. IN 12. Measure the peak to peak voltage and frequency of the output ripple using the oscilloscope. 13. Measure I using the corresponding multimeter. OUT I V OUT OUT 14. Calculate efficiency () using the equation: 100% P IN 15. Repeat steps 9-13 with the ac source set to 115 Vac / 60 Hz, 230 Vac / 50 Hz, 265 Vac / 50 Hz. Verify the results are within the limits of Table 2. 16. Turn off the ac source. 17. Since high voltage will be present after the voltage is removed, wait for the dc voltmeter to show approximately 0 V before continuing. 18. Disconnect the ac source. 19. Disconnect the oscilloscope. 20. Disconnect the electronic load. 21. Disconnect both multimeters. 22. End of test. Revision 0 - 12/9/2013 - 1 - www.onsemi.com Table 2: Desired Results V = 400 15 V OUT PF > 0.98 For 85 Vac / Output Ripple Voltage < 20 V PP 60 Hz input, Output Ripple Frequency = 120 Hz sine wave > 92% V = 400 15 V OUT PF > 0.98 For 115 Vac / Output Ripple Voltage < 20 V PP 60 Hz input, Output Ripple Frequency = 120 Hz sine wave > 94% V = 400 15 V OUT PF > 0.96 For 230 Vac / Output Ripple Voltage < 20 V PP 50 Hz input, Output Ripple Frequency = 100 Hz sine wave > 95% V = 400 15 V OUT PF > 0.96 For 265 Vac / Output Ripple Voltage < 20 V PP 50 Hz input, Output Ripple Frequency = 100 Hz sine wave > 95% Revision 0 - 12/9/2013 - 2 - www.onsemi.com

Tariff Desc

8543.70.00 Other machines and apparatus Free
13 Signal processors (graphic equalisers, crossovers etc.) 91 Other Free

9027.10.00 Instruments and apparatus for physical or chemical analysis (eg, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes Free

9031.80.00 MEASURING OR CHECKING INSTRUMENTS, APPLIANCES AND MACHINES, NOT SPECIFIED OR INCLUDED ELSEWHERE IN THIS CHAPTER; PROFILE PROJECTORS Other instruments, appliances and machines Free

9030.31.00 Oscilloscopes, spectrum analysers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, x-ray, cosmic or other ionising radiations.
Other instruments and apparatus, for measuring or checking voltage, current, resistance or power Multimeters without a recording device Free

8473.30.00 Parts and accessories of the machines of 8471 AUTOMATIC DATA PROCESSING MACHINES AND UNITS THEREOF; MAGNETIC OR OPTICAL READERS, MACHINES FOR TRANSCRIBING DATA ONTO DATA MEDIA IN CODED FORM AND MACHINES FOR PROCESSING SUCH DATA, NOT ELSEWHERE SPECIFIED OR INCLUDED:
.Other 71 No Weighing less than 1kg Free

8537 BOARDS, PANELS, CONSOLES, DESKS, CABINETS AND OTHER BASES, EQUIPPED WITH TWO OR MORE APPARATUS OF 8535 OR 8536, FOR ELECTRIC CONTROL OR THE DISTRIBUTION OF ELECTRICITY, INCLUDING THOSE INCORPORATING INSTRUMENTS OR APPARATUS OF CHAPTER 90, AND NUMERICAL CONTROL APPARATUS, OTHER THAN SWITCHING APPARATUS OF 8517:
8538 PARTS SUITABLE FOR USE SOLELY OR PRINCIPALLY WITH THE APPARATUS OF 8535, 8536 OR 8537:
8538.10.10 22 For programmable controllers Free
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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