MC10E116, MC100E116
5 V ECL Quint Differential
Line Receiver
Description
The MC10E/100E116 is a quint differential line receiver with
www.onsemi.com
emitter-follower outputs. For applications which require bandwidths
greater than that of the E116, the E416 device may be of interest.
Active current sources plus a deep collector feature of the MOSAIC
III process provide the receivers with excellent common-mode noise
rejection. Each receiver has a dedicated V supply lead, providing
CCO
optimum symmetry and stability.
If both inverting and non-inverting inputs are at an equal potential of
> 2.5 V, the receiver does not go to a defined state, but rather PLCC28
FN SUFFIX
current-shares in normal differential amplifier fashion, producing
CASE 77602
output voltage levels midway between HIGH and LOW, or the device
may even oscillate.
The V pin, an internally generated voltage supply, is available to
BB
this device only. For single-ended input conditions, the unused
MARKING DIAGRAM*
differential input is connected to V as a switching reference voltage.
BB
1
V may also rebias AC coupled inputs. When used, decouple V
BB BB
and V via a 0.01 F capacitor and limit current sourcing or sinking
CC
to 0.5 mA. When not used, V should be left open. MCxxxE116G
BB
The 100 Series contains temperature compensation.
AWLYYWW
Features
500 ps Max. Propagation Delay
xxx = 10 or 100
A = Assembly Location
V Supply Output
BB
WL = Wafer Lot
Dedicated V Pin for Each Receiver
CCO
YY = Year
PECL Mode Operating Range: V = 4.2 V to 5.7 V
WW = Work Week
CC
G = Pb-Free Package
with V = 0 V
EE
NECL Mode Operating Range: V = 0 V
CC *For additional marking information, refer to
Application Note AND8002/D.
with V = 4.2 V to 5.7 V
EE
Output Qs will default low when inputs are < V 2.5 V
CC
Internal Input 50 k Pulldown Resistors
ORDERING INFORMATION
Meets or Exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
Device Package Shipping
ESD Protection:
MC10E116FNG PLCC28 37 Units/Tube
> 2 kV Human Body Model
(Pb-Free)
> 200 V Machine Model
MC10E116FNR2G PLCC28 500 Tape & Reel
Moisture Sensitivity: Level 3 (Pb-Free)
(Pb-Free)
(For Additional Information, see Application Note AND8003/D)
MC100E116FNG PLCC28 37 Units/Tube
Flammability Rating: UL 94 V0 @ 0.125 in,
(Pb-Free)
Oxygen Index: 28 to 34
MC100E116FNR2G PLCC28 500 Tape & Reel
Transistor Count = 98 Devices
(Pb-Free)
These Devices are Pb-Free, Halogen Free and are RoHS Compliant
For information on tape and reel specifications, in-
cluding part orientation and tape sizes, please refer
to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
Semiconductor Components Industries, LLC, 2016
1 Publication Order Number:
July, 2016 Rev. 11 MC10E116/DMC10E116, MC100E116
D D D V Q Q V
3 4 4 CCO 4 4 CCO
25 24 23 22 21 20 19
D Q
0
0
Q
D 18
26 3
3
Q
D
0
0
17 Q
D 3
2 27
Q
D
1 1
D 28 16 V
2 CC
Q
D
1 1
1 Pinout: 28-Lead PLCC
V 15 Q
EE 2
(Top View) Q
D
2
2
14
V 2 Q
BB 2
Q
D
2 2
D 3 13 V
0 CCO
D Q
3
3
D
4 Q
0 12
1
Q
D
3
3
567 89 10 11
Q
D
4
4
D D V Q Q V Q
1 1 CCO 0 0 CCO 1
Q
D
4
4
* All V and V pins are tied together on the die.
CC CCO
V
Warning: All V , V , and V pins must be externally
CC CCO EE BB
connected to Power Supply to guarantee proper operation.
Figure 1. Pinout Assignment Figure 2. Logic Diagram
Table 1. PIN DESCRIPTION
PIN FUNCTION
D , D D , D ECL Differential Input Pairs
0 0 4 4
Q , Q Q , Q ECL Differential Output Pairs
0 0 4 4
V Reference Voltage Output.
BB
V , V Positive Supply
CC CCO
V Negative Supply
EE
Table 2. MAXIMUM RATINGS
Symbol Parameter Condition 1 Condition 2 Rating Unit
V PECL Mode Power Supply V = 0 V 8 V
CC EE
V NECL Mode Power Supply V = 0 V 6 V
EE CC
V PECL Mode Input Voltage V = 0 V V V 6 V
I EE I CC
NECL Mode Input Voltage V = 0 V V V 6
CC I EE
I Output Current Continuous 50 mA
out
Surge 100
I V Sink/Source 0.5 mA
BB BB
T Operating Temperature Range 0 to +85 C
A
T Storage Temperature Range 65 to +150 C
stg
Thermal Resistance (Junction-to-Ambient) 0 lfpm PLCC28 63.5 C/W
JA
500 lfpm PLCC28 43.5
Thermal Resistance (Junction-to-Case) Standard Board PLCC28 22 to 26 C/W
JC
T Wave Solder (Pb-Free) 265 C
sol
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
www.onsemi.com
2