Product Information

MC13851-2140EVK

MC13851-2140EVK electronic component of NXP

Datasheet
RF Development Tools MC13851 2140 EVK

Manufacturer: NXP
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



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RoHS - XON
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Tool Is For Evaluation Of
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Operating Supply Voltage
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Document Number: MC13851 Freescale Semiconductor Rev. 2.0, 12/2010 Data Sheet: Advance Information MC13851 Package Information Plastic Package: MLPD-8 2.0 2.0 0.6 mm Case: 2128-01 MC13851 General Purpose Low Noise Ordering Information Amplifier with Bypass Switch Device Device Marking Package MC13851EP 851 MLPD-8 Contents: 1 Introduction 1 Introduction .1 The MC13851 is a cost-effective, high IP3 LNA with low 2 Electrical Specifications .3 noise figure. This is the smaller leadless package version 3 Application Information 9 4 Printed Circuit and Bill of Materials .20 of the MC13821 device. The MC13851 includes an 5 Scattering and Noise Parameters .22 integrated bypass switch to preserve high input intercept 6 Packaging 32 performance in variable signal strength environments 7 Product Documentation .33 and boosts dynamic range. On-chip bias circuitry offers 8 Revision History .33 low system cost. The input and output match are external to allow maximum design flexibility. An external resistor is used to set device current which allows balancing required linearity with low current consumption. Gain is optimized for applications greater than 1000 MHz. The MC13851 is fabricated with the advanced RF BiCMOS process using the eSiGe:C module and is available in the 2 2 mm MLPD-8 leadless package, offering a small, low height, easy-to-solder solution for applications with tight printed circuit board placement requirements. This document contains information on a new product. Specifications and information herein are subject to change without notice. Freescale Semiconductor, Inc., 20062010. All rights reserved. Introduction 1.1 Features The MC13851 is intended for applications from 1000 MHz to 2500 MHz and the MC13852 is for applications less than 1000 MHz. Gain: 18.7 dB (typical) at 1960 MHz and 17.7 dB (typical) at 2140 MHz Output third order intercept point (OIP3): 16 dBm at 1960 MHz and 17 dBm (typical) dBm at 2140 MHz Noise Figure (NF): 1.37 dB (typica l) at 1960 MHz and 1.46 dB at 2140 MHz Output 1 dB compression point (P1dB): 8 dBm (typical) at 1960 MHz and 8 dBm (typical) at 2140 MHz IP3 Boost Circui try from Freescale Bypass mode has return losses comparable to ac tive mode, for use in systems with filters and duplexers Bypass mode improves dynamic range in variable signal strength environments Integrated logic-controlled sta ndby mode with current drain < 1uA Total supply current variable from 2.5 mA5 mA using an external bias resistor In a receiver system with 20% active mode and 80% bypass mode, the average current drain is < 0.6 mA On-chip bias sets the bias point Bias stabilized for device and temperature variations MLPD-8 leadless package with low parasitics 1575 MHz, 1960 MHz, 2140 MHz and 2500 MHz appl ication circuit evaluation boards with characterization data are available Available in tape and reel packaging 1.2 Applications Ideal for use in any RF product that operates between 1000 MHz and 2.5 GHz, and may be applied in: Buffer amplifiers Mixers IF amplifiers Voltage controlled oscillators (VCOs) Use with transceivers requiring external LNAs Smart metering MobileCellular front end LNA, GPS, two-way radios ConsumerWLAN, 802.11 b/g AutoGPS, active antenna, wireless security Low current drain/long standby time for extended battery life applications MC13851 Advance Information, Rev. 2.0 2 Freescale Semiconductor

Tariff Desc

8543.70.00 Other machines and apparatus Free
13 Signal processors (graphic equalisers, crossovers etc.) 91 Other Free

9027.10.00 Instruments and apparatus for physical or chemical analysis (eg, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes Free

9031.80.00 MEASURING OR CHECKING INSTRUMENTS, APPLIANCES AND MACHINES, NOT SPECIFIED OR INCLUDED ELSEWHERE IN THIS CHAPTER; PROFILE PROJECTORS Other instruments, appliances and machines Free

9030.31.00 Oscilloscopes, spectrum analysers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, x-ray, cosmic or other ionising radiations.
Other instruments and apparatus, for measuring or checking voltage, current, resistance or power Multimeters without a recording device Free

8473.30.00 Parts and accessories of the machines of 8471 AUTOMATIC DATA PROCESSING MACHINES AND UNITS THEREOF; MAGNETIC OR OPTICAL READERS, MACHINES FOR TRANSCRIBING DATA ONTO DATA MEDIA IN CODED FORM AND MACHINES FOR PROCESSING SUCH DATA, NOT ELSEWHERE SPECIFIED OR INCLUDED:
.Other 71 No Weighing less than 1kg Free

8537 BOARDS, PANELS, CONSOLES, DESKS, CABINETS AND OTHER BASES, EQUIPPED WITH TWO OR MORE APPARATUS OF 8535 OR 8536, FOR ELECTRIC CONTROL OR THE DISTRIBUTION OF ELECTRICITY, INCLUDING THOSE INCORPORATING INSTRUMENTS OR APPARATUS OF CHAPTER 90, AND NUMERICAL CONTROL APPARATUS, OTHER THAN SWITCHING APPARATUS OF 8517:
8538 PARTS SUITABLE FOR USE SOLELY OR PRINCIPALLY WITH THE APPARATUS OF 8535, 8536 OR 8537:
8538.10.10 22 For programmable controllers Free
FR9
Freescale
FREESCALE SEMI
Freescale Semicon
FREESCALE SEMICONDUC
Freescale Semiconductor
Freescale Semiconductor - NXP
NXP
NXP Freescale
NXP (FREESCALE)
NXP / Freescale
NXP SEMI
NXP Semicon
NXP SEMICONDUCTOR
NXP Semiconductors
NXP USA Inc.
PH3
PHI

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