Reference Only Spec No. JELF243B-0012L-01 P.1/8 CHIP COIL (CHIP INDUCTORS) LQM18FN00D REFERENCE SPECIFICATION 1. Scope This reference specification applies to LQM18FN 00 series, Chip Coil (Chip Inductors). 2. Part Numbering (ex) LQ M 18 F N 1R0 M 0 0 D Product ID Structure Dimension Applications Category Inductance Tolerance Features Electrode Packaging (LW) and D: Taping Characteristics *B: BULK *B: Bulk packing also available 3. Rating Operating Temperature Range 55C to + 125C Storage Temperature Range 55C to + 125C Self Customer MURATA DC Rated Inductance Resonant Part Number Part Number Resistance Current Frequency (H) Tolerance () (MHz min.) (mA) LQM18FN1R0M00D 1.0 0.2030% 120 150 LQM18FN2R2M00D 0.4030% 2.2 80 120 20% LQM18FN4R7M00D 0.6030% 4.7 50 80 LQM18FN100M00D 10 0.9030% 30 50 4. Appearance and Dimensions Electrode Ferrite 0.30.2 0.80.1 Unit Mass (Typical value) 0.005g (in mm) 1.60.1 0.80.1 5. Testing Conditions Unless otherwise specified In case of doubt Temperature : Ordinary Temperature / 15C to 35C Temperature : 20C 2C Humidity : Ordinary Humidity / 25%(RH) to 85%(RH) Humidity : 60%(RH) to 70%(RH) Atmospheric Pressure : 86kPa to 106kPa MURATA MFG.CO., LTD Reference Only Spec No. JELF243B-0012L-01 P.2/8 6. Electrical Performance No. Item Specification Test Method 6.1 Inductance Inductance shall meet item 3. Measuring Equipment: KEYSIGHT 4294A or equivalent (1mA) Measuring Frequency: 1MHz 6.2 DC Resistance DC Resistance shall meet item 3. Measuring Equipment: Digital multi meter Digital multi meter (TR6846 or equivalent) a terminal1 terminal2 SW b DC resistance shall be measured after putting chip coil between the terminal 2 under the condition of opening between a and b. Every measurement the terminal 1 shall be shorted between a and b when changing chip coil. Measuring Equipment: 6.3 Self Resonant S.R.F shall meet item 3. KEYSIGHT 4294A or equivalent Frequency (S.R.F) 6.4 Rated Current Self temperature rise shall be limited The rated current is applied. to 25C max. Inductance Change: within 50% 7. Mechanical Performance No. Item Specification Test Method 7.1 Shear Test Chip coil shall not be damaged after Applied Direction Chip Coil tested as follows. F Substrate Force: 10N Hold Duration: 5s1s Applied Direction: Parallel to PCB 7.2 Bending Test Substrate: Glass-epoxy substrate (100mm40mm1.6mm) Pressure jig R340 F Deflection 45 45 Product (in mm) Speed of Applying Force: 1mm / s Deflection: 2mm Hold Duration: 30s 7.3 Vibration Oscillation Frequency: 10Hz to 55Hz to 10Hz for 1 min Total Amplitude: 1.5mm Testing Time: A period of 2h in each of 3 mutually perpendicular directions. MURATA MFG.CO., LTD