Product Information

GCJ32ER71E106KA18K

GCJ32ER71E106KA18K electronic component of Murata

Datasheet
Multilayer Ceramic Capacitors MLCC - SMD/SMT 1210 10uF 25volts X7R 10% Soft Term

Manufacturer: Murata
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

1: USD 0.6704 ea
Line Total: USD 0.67

26346 - Global Stock
Ships to you between
Thu. 09 May to Mon. 13 May
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
37207 - Global Stock


Ships to you between Fri. 03 May to Thu. 09 May

MOQ : 1
Multiples : 1
1 : USD 0.3099
10 : USD 0.3047
25 : USD 0.2805
100 : USD 0.2449
250 : USD 0.2319
500 : USD 0.2313
1000 : USD 0.2305
3000 : USD 0.2299
6000 : USD 0.2252
15000 : USD 0.2252
30000 : USD 0.2252

26346 - Global Stock


Ships to you between Thu. 09 May to Mon. 13 May

MOQ : 1
Multiples : 1
1 : USD 0.6704
10 : USD 0.4025
100 : USD 0.3289
500 : USD 0.2829
1000 : USD 0.2438
4000 : USD 0.2219
8000 : USD 0.215
24000 : USD 0.215

     
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RoHS - XON
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Soft Termination Chip Multilayer Ceramic Capacitors for Automotive GCJ32ER71E106KA18 (1210, X7R:EIA, 10uF, DC25V) : packaging code Reference Sheet 1.Scope This product specification is applied to Soft Termination Chip Multilayer Ceramic Capacitors used for Automotive Electronic equipment. 2.MURATA Part NO. System (Ex.) GCJ 32 E R7 1E 106 K A18 L (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 3.20.4 2.50.3 2.50.3 0.3 min. 1.0 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X7R(EIA) (5) Nominal Methods Rated Capacitance Temp. coeff Temp. Range Capacitance (Operating Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 125 C -15 to 15 % DC 25 V 10 uF 10 % -55 to 125 C (25 C) Soldering Method Reflow 5.Package mark (8) Packaging Packaging Unit f180mm Reel L 1000 pcs./Reel EMBOSSED W8P4 f330mm Reel K 4000 pcs./Reel EMBOSSED W8P4 Product specifications in this catalog are as of May.22,2018,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCJ32ER71E106KA18-01 1AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specification. AEC-Q200 Test Method 1 Pre-and Post-Stress - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Exposure (Storage) specifications in the following table. Set the capacitor for 1000+/-12h at 150+/-3. Appearance No marking defects Set for 24+/-2h at room temperature, then measure. Capacitance Within +/-12.5% Change Initial measurement for high dielectric constant type D.F. Within the specified initial value. Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature.Perform the initial measurement. Insulation Within the specified initial value. Resistance 25 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Perform the 1000 cycles test according to the four heat treatments Appearance No marking defects listed in the following table. Set for 24+/-2h at room temperature, then measure. Step 1 2 3 4 Capacitance Within +/-7.5% Temp. Room Room Min.Operating Temp.+0/-3 Max.Operating Temp. +3/-0 Change ( C) Temp. Temp. Time 15+/-3 1 15+/-3 1 D.F. Within the specified initial value. (min.) Insulation Within the specified initial value. Initial measurement Resistance Perform a heat treatment at 150+0/-10 for 1h and then sit 25 for 24+/-2h at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469 Physical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the 24h heat (25 to 65) and humidity (80%RH to 98%RH) Appearance No marking defects treatment shown below, 10 consecutive times. Set for 24+/-2h at room temperature, then measure. Humidity Humidity Temperature 8098% 8098% Capacitance Within +/-10.0% Humidity Humidity Humidity () 9098% 9098% 9098% Change 70 65 60 D.F. Within the specified initial value. 55 50 45 40 35 Insulation Within the specified initial value. 30 25 Resistance +10 20 25 - 2 15 10 5 Initial measuremt 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours Initial measurement Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature. Perform the initial measurement. 6 Biased Humidity The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8k resister) Appearance No marking defects at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12h. The charge/discharge current is less than 50mA. Capacitance Within +/-12.5% Remove and set for 24+/-2h at room temperature, then measure. Change Initial measurement D.F. Within the specified initial value. Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature. Perform the initial measurement. Insulation More than 25F Resistance 25 JEMCGS-02461E 2

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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