Product Information

GCJ188L81H102KA01D

GCJ188L81H102KA01D electronic component of Murata

Datasheet
Multilayer Ceramic Capacitors MLCC - SMD/SMT 0603 1000pF 50volts X8L 10% Soft Term

Manufacturer: Murata
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

1: USD 0.3028 ea
Line Total: USD 0.3

0 - Global Stock
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
0 - WHS 1


Ships to you between Mon. 27 May to Fri. 31 May

MOQ : 4000
Multiples : 4000
4000 : USD 0.0523
8000 : USD 0.0503
16000 : USD 0.0484
20000 : USD 0.0484
60000 : USD 0.0484

0 - WHS 2


Ships to you between Fri. 31 May to Tue. 04 Jun

MOQ : 40000
Multiples : 40000
40000 : USD 0.0448
80000 : USD 0.0437

     
Manufacturer
Product Category
RoHS - XON
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Capacitance
Voltage Rating DC
Tolerance
Dielectric
Case Code - in
Case Code - mm
Minimum Operating Temperature
Maximum Operating Temperature
Termination
Termination Style
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Capacitance - Nf
Capacitance - Uf
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Soft Termination Chip Multilayer Ceramic Capacitors for Automotive GCJ188L81H102KA01 (0603, X8L:EIA, 1000pF, DC50V) : packaging code Reference Sheet 1.Scope This product specification is applied to Soft Termination Chip Multilayer Ceramic Capacitors used for Automotive Electronic equipment. 2.MURATA Part NO. System (Ex.) GCJ 18 8 L8 1H 102 K A01 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 1.60.2 0.80.1 0.80.1 0.2 to 0.5 0.5 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X8L(EIA) (5) Nominal Methods Rated Capacitance (Operating Temp. coeff Temp. Range Capacitance Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 150 C -40 to 15 % DC 50 V 1000 pF 10 % -55 to 150 C (25 C) Soldering Method Reflow 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 4000 pcs./Reel PAPER W8P4 f330mm Reel J 10000 pcs./Reel PAPER W8P4 Product specifications in this catalog are as of Dec.6,2017,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCJ188L81H102KA01-01 1AEC-Q200 Murata Standard Specification and Test Methods AEC-Q200 Test Item No Specification. AEC-Q200 Test Method 1 Pre-and Post-Stress - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Exposure (Storage) specifications in the following table. Set the capacitor for 1000+/-12h at 150+/-3. Appearance No marking defects Set for 24+/-2h at room temperature, then measure. Capacitance Within +/-12.5% Change Initial measurement for high dielectric constant type D.F. Within the specified initial value. Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature.Perform the initial measurement. Insulation Within the specified initial value. Resistance 25 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Perform the 1000 cycles test according to the four heat treatments Appearance No marking defects listed in the following table. Set for 24+/-2h at room temperature, then measure. Step 1 2 3 4 Capacitance Within +/-7.5% Temp. Room Room Min.Operating Temp.+0/-3 Max.Operating Temp. +3/-0 Change ( C) Temp. Temp. Time 15+/-3 1 15+/-3 1 D.F. Within the specified initial value. (min.) Insulation Within the specified initial value. Initial measurement Resistance Perform a heat treatment at 150+0/-10 for 1h and then sit 25 for 24+/-2h at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469 Physical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the 24h heat (25 to 65) and humidity (80%RH to 98%RH) Appearance No marking defects treatment shown below, 10 consecutive times. Set for 24+/-2h at room temperature, then measure. Humidity Humidity Temperature 8098% 8098% Capacitance Within +/-10.0% Humidity Humidity Humidity () 9098% 9098% 9098% Change 70 65 60 D.F. Within the specified initial value. 55 50 45 40 35 Insulation Within the specified initial value. 30 25 Resistance +10 20 25 - 2 15 10 5 Initial measuremt 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours Initial measurement Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature. Perform the initial measurement. 6 Biased Humidity The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8k resister) Appearance No marking defects at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12h. The charge/discharge current is less than 50mA. Capacitance Within +/-12.5% Remove and set for 24+/-2h at room temperature, then measure. Change Initial measurement D.F. Within the specified initial value. Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature. Perform the initial measurement. Insulation More than 1,000M or 50F Resistance (Whichever is smaller) 25 JEMCGS-02174C 2

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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