Product Information

MT28EW256ABA1HJS-0SIT

MT28EW256ABA1HJS-0SIT electronic component of Micron

Datasheet
NOR Flash Parallel 3V 256Mbit 32M/16M 8bit/16bit 105ns 56-Pin TSOP

Manufacturer: Micron
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

1: USD 9.1408 ea
Line Total: USD 9.14

2088 - Global Stock
Ships to you between
Thu. 23 May to Mon. 27 May
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
528 - WHS 1


Ships to you between Fri. 17 May to Thu. 23 May

MOQ : 576
Multiples : 545
576 : USD 8.4703
580 : USD 8.3511
1200 : USD 8.1124
2900 : USD 7.9335
5800 : USD 7.6353
29000 : USD 7.516
58000 : USD 7.3966

3 - WHS 2


Ships to you between
Fri. 24 May to Wed. 29 May

MOQ : 1
Multiples : 1
1 : USD 15.0693
10 : USD 14.437
30 : USD 13.3414
100 : USD 12.3876

2088 - WHS 3


Ships to you between Thu. 23 May to Mon. 27 May

MOQ : 1
Multiples : 1
1 : USD 9.1408
10 : USD 8.5612
25 : USD 8.3801
100 : USD 7.5831
250 : USD 7.4624
2880 : USD 7.3054
5184 : USD 7.1846

     
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256Mb: x8/x16, 3V, MT28EW Embedded Parallel NOR Features Parallel NOR Flash Embedded Memory MT28EW256ABA BLANK CHECK operation to verify an erased block Features CYCLIC REDUNDANCY CHECK (CRC) operation to Single-level cell (SLC) process technology verify a program pattern Density: 256Mb V /WP protection PP Supply voltage Protects first or last block regardless of block V = 2.73.6V (program, erase, read) CC protection settings V = 1.65 - V (I/O buffers) CCQ CC Software protection Asynchronous random/page read Volatile protection Page size: 16 words or 32 bytes Nonvolatile protection Page access: 20ns Password protection Random access: 70ns (V = V = 2.7-3.6V) CC CCQ Extended memory block Random access: 75ns (V = 1.65-V ) CCQ CC 128-word (256-byte) block for permanent, secure Buffer program (512-word program buffer) identification 2.0 MB/s (TYP) when using full buffer program Programmed or locked at the factory or by the 2.5 MB/s (TYP) when using accelerated buffer customer program (V ) HH JESD47-compliant Word/Byte program: 25us per word (TYP) 100,000 (minimum) ERASE cycles per block Block erase (128KB): 0.2s (TYP) Data retention: 20 years (TYP) Memory organization Package Uniform blocks: 128KB or 64KW each 56-pin TSOP, 14 x 20mm (JS) x8/x16 data bus 64-ball LBGA, 11 x 13mm (PC) Program/erase suspend and resume capability 56-ball VFBGA, 7 x 9mm (PN) Read from another block during a PROGRAM RoHS-compliant, halogen-free packaging SUSPEND operation Operating temperature Read or program another block during an ERASE Ambient: 40C to +85C SUSPEND operation Unlock bypass, block erase, chip erase, and write to buffer capability PDF: 09005aef85477990 Micron Technology, Inc. reserves the right to change products or specifications without notice. 1 mt28e-W256-ABA-S-IT.pdf - Rev. G 05/18 EN 2014 Micron Technology, Inc. All rights reserved. Products and specifications discussed herein are subject to change by Micron without notice.256Mb: x8/x16, 3V, MT28EW Embedded Parallel NOR Features Part Numbering Information For available options, such as packages or high/low protection, or for further information, contact your Micron sales representative. Part numbers can be verified at www.micron.com. Feature and specification comparison by device type is available at www.micron.com/products. Contact the factory for devices not found. Figure 1: Part Number Chart MT 28E W 512 A B A 1 H JS - 0 S IT ES Micron Technology Production Status Blank = Production Part Family ES = Engineering sample 28E = Embedded Parallel NOR Operating Temperature Voltage IT = 40C to +85C W = 2.73.6V V core CC Special Options Density S = Standard 128 = 128Mb 256 = 256Mb Security Features 512 = 512Mb 0 = Standard default security 01G = 1Gb 1 = OTP configurable 02G = 2Gb Package Codes Stack JS = 56-pin TSOP, 14mm x 20mm A = Single die PN = 56-ball VFBGA, 7mm x 9mm B = Two die PC = 64-ball LBGA, 11mm x 13mm (All packages are lead-free, halogen-free, RoHS-compliant) Device Generation B = 2nd generation Block Structure H = High lock Die Revision L = Low lock A = Rev A Configuration 1 = x8, x16 PDF: 09005aef85477990 Micron Technology, Inc. reserves the right to change products or specifications without notice. 2 mt28e-W256-ABA-S-IT.pdf - Rev. G 05/18 EN 2014 Micron Technology, Inc. All rights reserved.

Tariff Desc

8542.32.00 32 No ..CMOS and MOS Read Only Memory and Programmable Read Only Memory whether erasable or non-erasable (for example, flash memory, EPROM, E2PROM, EAPROM, NOVRAM, ROM and PROM)
EL9
Elpida Memory
ELPIDA MEMORY INC
IE6
MI9
MICRON SEMICONDUCTOR
Micron Tech
MICRON TECHNOLOGY
Micron Technology Inc
Micron Technology Inc.
NU9
Numonyx - A DIVISION OF MICRON SEMICONDUCTOR PRODUCTS, INC. (VA)

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