Product Information

BRKOUT-FXLS8471Q

BRKOUT-FXLS8471Q electronic component of NXP

Datasheet
Acceleration Sensor Development Tools Breakout board FXLS8471Q

Manufacturer: NXP
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

1: USD 20.1653 ea
Line Total: USD 20.17

0 - Global Stock
MOQ: 1  Multiples: 1
Pack Size: 1
     
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Freescale Semiconductor Document Number: FXLS8471Q Data Sheet: Technical Data Rev. 1.5, 06/2015 An Energy-Efficient Solution by Freescale FXLS8471Q, 3-Axis, Linear Accelerometer FXLS8471Q FXLS8471Q is a small, low-power, 3-axis, linear accelerometer in a 3 mm x 3 mm x 1 mm QFN package. FXLS8471Q has dynamically selectable acceleration full-scale ranges of 2 g/4 g/8 g and 14 bits of resolution. 2 Output data rates (ODR) are programmable from 1.563 Hz to 800 Hz. I C and SPI serial digital interfaces are provided along with several user programmable event detection functions that can be used to reduce the overall system power consumption by off-loading the host processor. FXLS8471Q is guaranteed to operate over the extended temperature range of -40 C to +85 C. Features 16 LEAD QFN 3 mm x 3 mm x 1 mm 1.95 V to 3.6 V VDD supply voltage, 1.62 V to 3.6 V VDDIO voltage 2 g/4 g/8 g dynamically selectable acceleration full-scale ranges Output Data Rates (ODR) from 1.563 Hz to 800 Hz Top View Low noise: typically 99 g/Hz in low-noise mode 200-Hz bandwidth 14-bit ADC resolution: 0.244 mg/LSB in 2 g, full-scale range 16 15 14 Embedded programmable acceleration event functions: VDDIO 1 13 Reserved Freefall and Motion Detection BYP 2 12 GND Transient Detection Reserved 3 11 INT1 Vector-Magnitude Change Detection FXLS8471Q Pulse and Tap Detection (Single and Double) SCL/SCLK 4 10 SA1/CS B Orientation Detection (Portrait/Landscape) GND 5 9 INT2 Programmable automatic ODR change using Auto-Wake and return to 6 78 Sleep functions to save power. 192-byte FIFO buffer, capable of storing up to 32 samples of X/Y/Z data 2 Supports 4-wire SPI interface at up to 1 MHz I C Normal (100 kHz) and Fast Modes (400 kHz) Pin Connections Integrated accelerometer self-test function Target Markets Industrial applications: vibration analysis, machine health monitoring, and platform stabilization Smartphones, tablets, digital cameras, and personal navigation devices Medical applications: patient monitoring, fall detection, and rehabilitation Applications Shock and vibration monitoring (mechatronic compensation, shipping, and warranty usage logging) User interface (menu scrolling by orientation change, tap detection for button replacement) Orientation detection (portrait/landscape: up/down, left/right, back/front position identification) Gaming and real-time activity analysis (pedometry, freefall and drop detection for hard disk drives and other devices) Power management for mobile devices using inertial event detection Freescale reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. 2013-2015 Freescale Semiconductor, Inc. All rights reserved. FXLS8471Q RST SDA/MOSI N/C SA0/MISO VDD N/CORDERING INFORMATION Part Number Temperature Range Package Description Shipping FXLS8471QR1 -40C to +85C QFN-16 Tape and Reel (1 k) Related Documentation The FXLS8471Q device features and operations are described in a variety of reference manuals, user guides, and application notes. To find the most-current versions of these documents: 1. Go to the Freescale homepage at:

Tariff Desc

8543.70.00 - Other machines and apparatus Free
13 No Signal processors (graphic equalisers, crossovers etc.)
91 .. Other

9027.10.00 Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes.

9031.80.00 - MEASURING OR CHECKING INSTRUMENTS, APPLIANCES AND MACHINES, NOT SPECIFIED OR INCLUDED ELSEWHERE IN THIS CHAPTER; PROFILE PROJECTORS Other instruments, appliances and machines Free
FR9
Freescale
FREESCALE SEMI
Freescale Semicon
FREESCALE SEMICONDUC
Freescale Semiconductor
Freescale Semiconductor - NXP
NXP
NXP Freescale
NXP (FREESCALE)
NXP / Freescale
NXP SEMI
NXP Semicon
NXP SEMICONDUCTOR
NXP Semiconductors
NXP USA Inc.
PH3
PHI

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