Product Information

GCM1885C1H8R0DA16D

GCM1885C1H8R0DA16D electronic component of Murata

Datasheet
Multilayer Ceramic Capacitors MLCC - SMD/SMT SMALLER ALTERNATIVE 81-GCM1555C1H8R0DA6D. SEE DATASHEET TO VERIFY FOR YOUR APP.

Manufacturer: Murata
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

20: USD 0.0374 ea
Line Total: USD 0.748

1280 - Global Stock
Ships to you between
Thu. 11 Apr to Tue. 16 Apr
MOQ: 20  Multiples: 20
Pack Size: 20
Availability Price Quantity
1280 - Global Stock


Ships to you between
Thu. 11 Apr to Tue. 16 Apr

MOQ : 20
Multiples : 20
20 : USD 0.0374
200 : USD 0.0311
600 : USD 0.0275
4000 : USD 0.0212
8000 : USD 0.0195
20000 : USD 0.0183

19202 - Global Stock


Ships to you between Wed. 10 Apr to Fri. 12 Apr

MOQ : 1
Multiples : 1
1 : USD 0.2875
10 : USD 0.1806
100 : USD 0.1035
1000 : USD 0.0667
4000 : USD 0.0633
8000 : USD 0.0517
24000 : USD 0.0483
48000 : USD 0.0471
100000 : USD 0.0414

     
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RoHS - XON
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CHIP MONOLITHIC CERAMIC CAPACITOR FOR AUTOMOTIVE GCM1885C1H8R0DA16 (0603, C0G, 8pF, 50Vdc) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Monolithic Ceramic Capacitor used for Automotive Electronic equipment. 2.MURATA Part NO. System (Ex.) GCM 18 8 5C 1H 8R0 D A16 D (1)L/W (2)T (3)Temperature (4)DC Rated (5)Nominal (6)Capacitance (7)Muratas (8)Packaging Dimensions Characteristics Voltage Capacitance Tolerance Control Code Code Dimensions 3. Type & Dimensions L W T e g e (Unit:mm) (1)-1 L (1)-2 W (2) T e g 1.60.1 0.80.1 0.80.1 0.2 to 0.5 0.5 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):C0G(EIA) (5) Nominal Methods DC Rated Capacitance (Operationg Temp. coeff Temp. Range Capacitance Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) 25 to 125 C 50 Vdc 8 pF 0.5 pF 030 ppm/C -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 4000 pcs./Reel PAPER W8P4 f330mm Reel J 10000 pcs./Reel PAPER W8P4 Product specifications in this catalog are as of Dec.20,2012,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCM1885C1H8R0DA16-01 1AEC-Q200 Murata Standard Specification and Test Methods Specification. No AEC-Q200 Test Item AEC-Q200 Test Method Temperature High Dielectric Type Compensating Type Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Set the capacitor for 100012 hours at 1503. Set for Exposure (Storage) specifications in the following table. 242 hours at room temperature, then measure. Appearance No marking defects Capacitance Within 2.5% or 0.25pF R7/L8/R9: Within 10.0% Change (Whichever is larger) Q/D.F. 30pFmin. : Q1000 R7/L8 W.V.: 25Vmin.: 0.03 max. 30pFmax.: Q 400+20C W.V.: 16V/10V : 0.05 max. C: Nominal Capacitance(pF) R9 : 0.075max. I.R. More than 10,000M or 500 F (Whichever is smaller) R9 : More than 150 F 3 Temperature Cycling The measured and observed characteristics should satisfy the Fix the capacitor to the supporting jig in the same manner and under specifications in the following table. the same conditions as (19). Perform cycle test according to the four Appearance No marking defects heat treatments listed in the following table. Set for 242 hours at Capacitance Within 2.5% or 0.25pF R7/L8/R9: Within 10.0% room temperature, then measure Change (Whichever is larger) Cycles Q/D.F. 30pFmin. : Q1000 R7/L8 W.V.: 25Vmin.: 0.03 max. Step Time(min) 1000(for C/R7) 300(for 5G/L8/R9) 30pFmax.: Q 400+20C W.V.: 16V/10V : 0.05 max. 1 153 -55+0/-3 -55+0/-3 C: Nominal Capacitance(pF) R9 : 0.05max. 2 1 Room Room 3 153 125+3/-0 150+3/-0 I.R. More than 10,000M or 500 F 4 1 Room Room (Whichever is smaller) Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10 for one hour and then set for 242 hours at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469. Phisical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Apply the 24-hour heat (25 to 65) and humidity (80 to 98%) specifications in the following table. treatment shown below, 10 consecutive times. Set for 242 hours at room temperature, then measure. Appearance No marking defects Capacitance Humidity Humidity Within 3.0% or 0.30pF R7/L8/R9: Within 12.5% Temperature 8098% 8098% Humidity Humidity Humidity Change (Whichever is larger) () 9098% 9098% 9098% 70 Q/D.F. 30pFmin. : Q350 R7/L8 : W.V.: 25Vmin.: 0.03 max. 65 60 10pF and over, 30pF and below: W.V.: 16V/10V : 0.05 max. 55 50 Q275+5C/2 R9 : 0.075max. 45 10pFmax.: Q 200+10C 40 35 C: Nominal Capacitance(pF) 30 25 I.R. More than 10,000M or 500 F +10 20 - 2 15 (Whichever is smaller) 10 R9 : More than 150 F 5 Initial measuremt 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours 6 The measured and observed characteristics should satisfy the Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) Biased Humidity specifications in the following table. at 853 and 80 to 85% humidity for 100012 hours. Remove and set for 242 hours at room temprature, then measure. Appearance No marking defects The charge/discharge current is less than 50mA. Capacitance Within 3.0% or 0.30pF R7/L8/R9: Within 12.5% Change (Whichever is larger) Q/D.F. 30pF and over: Q200 R7/L8 W.V.: 25Vmin.: 0.035 max. 30pF and below: Q100+10C/3 W.V.: 16V/10V : 0.05 max. C: Nominal Capacitance(pF) R9 : 0.075max. I.R. More than 1,000M or 50 F (Whichever is smaller) JEMCGS-0363S 2

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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