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DS21372T+

DS21372T+ electronic component of Analog Devices

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Communication ICs - Various 3.3V Bit Error Rate Tester (BERT)

Manufacturer: Analog Devices
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Multiples : 250

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DS21372T+
Analog Devices

N/A

Obsolete
0 - Global Stock

MOQ : 1
Multiples : 1

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DS21372T+
Analog Devices

1 : USD 17.3124
10 : USD 16.1028
25 : USD 15.4476
100 : USD 14.0902
250 : USD 12.3093
1000 : USD 12.1518
N/A

Obsolete
     
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DS21372 3.3V Bit Error Rate Tester (BERT) www.dalsemi.com PIN ASSIGNMENT FEATURES Generates/detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems Operates at speeds from DC to 20 MHz Programmable polynomial length and 32 31 30 29 28 27 26 25 feedback taps for generation of any other TL 1 24 RL AD0 2 23 RLOS pseudorandom pattern up to 32 bits in length 6 9 11 15 20 23 AD1 3 22 LC including: 2 -1, 2 -1, 2 -1, 2 -1, 2 -1, 2 -1, TEST 4 DS21372 21 VSS 32 32-PIN TQFP and 2 -1 VSS 5 20 VDD AD2 6 19 INT Programmable user-defined pattern and AD3 7 18 WR(R/W) length for generation of any repetitive pattern ALE (AS) AD4 8 17 9 10 11 12 13 14 15 16 up to 32 bits in length Large 32-bit error count and bit count registers Software programmable bit error insertion Fully independent transmit and receive sections ORDERING INFORMATION 8-bit parallel control port 0 0 DS21372 (0 C to 70 C) Detects test patterns with bit error rates up to 0 0 DS21372N (-40 C to +85 C) -2 10 DESCRIPTION The DS21372 Bit Error Rate Tester (BERT) is a software programmable test pattern generator, receiver, and analyzer capable of meeting the most stringent error performance requirements of digital transmission facilities. Two categories of test pattern generation (Pseudo-random and Repetitive) conform to CCITT/ITU O.151, O.152, O.153, and O.161 standards. The DS21372 operates at clock rates ranging from DC to 20 MHz. This wide range of operating frequency allows the DS21372 to be used in existing and future test equipment, transmission facilities, switching equipment, multiplexers, DACs, Routers, Bridges, CSUs, DSUs, and CPE equipment. The DS21372 user-programmable pattern registers provide the unique ability to generate loopback patterns required for T1, Fractional-T1, Smart Jack, and other test procedures. Hence the DS21372 can initiate the loopback, run the test, check for errors, and finally deactivate the loopback. The DS21372 consists of four functional blocks: the pattern generator, pattern detector, error counter, and control interface. The DS21372 can be programmed to generate any pseudorandom pattern with length up 32 to 2 -1 bits (see Table 5, Note 9) or any user programmable bit pattern from 1 to 32 bits in length. Logic inputs can be used to configure the DS21372 for applications requiring gap clocking such as Fractional- T1, Switched-56, DDS, normal framing requirements, and per-channel test procedures. In addition, the -1 -7 DS21372 can insert single or 10 to 10 bit errors to verify equipment operation and connectivity. 1 of 22 101000 AD5 TDATA AD6 TDIS AD7 TCLK VSS VSS VDD VDD BTS RCLK RD(DS) RDIS CS RDATADS21372 1. GENERAL OPERATION 1.1 PATTERN GENERATION The DS21372 is programmed to generate a particular test pattern by programming the following registers: - Pattern Set Registers (PSR) - Pattern Length Register (PLR) - Polynomial Tap Register (PTR) - Pattern Control Register (PCR) - Error Insertion Register (EIR) Please see Tables 4 and 5 for examples of how to program these registers in order to generate some standard test patterns. Once these registers are programmed, the user will then toggle the TL (Transmit Load) bit or pin to load the pattern into the onboard pattern generation circuitry and the pattern will begin appearing at the TDATA pin. 1.2 PATTERN SYNCHRONIZATION The DS21372 expects to receive the same pattern that it transmitted. The synchronizer examines the data at RDATA and looks for characteristics of the transmitted pattern. The user can control the onboard synchronizer with the Sync Enable and Resync bits in the Pattern Control Register. In pseudorandom mode, the received pattern is tested to see if it fits the polynomial generator as defined in the transmit side. For pseudorandom patterns, only the original pattern and an all ones pattern or an all 0s pattern will satisfy this test. Synchronization in pseudorandom pattern mode should be qualified by using the RA1 and RA0 indicators in the Status Register. Synchronization is declared after 34 + n bits are received without error, where n is the exponent in the polynomial from Table 4. Once in synchronization (SR.0 = 1) any deviation from this pattern will be counted by the Bit Error Count Register. In repetitive pattern mode a received pattern of the same length as being transmitted will satisfy this test. Synchronization in repetitive pattern mode should be qualified by using the RA1 and RA0 indicators in the Status Register and examining the Pattern Receive Register (PRR0--3). See section 10 for an explanation of the Pattern Receive Register. Once in synchronization (SR.0 = 1) any deviation from this pattern will be counted by the Bit Error Count Register. 1.3 BER CALCULATION Users can calculate the actual Bit Error Rate (BER) of the digital communications channel by reading the bit error count out of the Bit Error Count Register (BECR) and reading the bit count out of the Bit Count Register (BCR) and then dividing the BECR value with the BCR value. The user has total control over the integration period of the measurement. The LC (Load Count) bit or pin is used to set the integration period. 1.4 GENERATING ERRORS Via the Error Insertion Register (EIR), the user can intentionally inject a particular error rate into the transmitted data stream. Injecting errors allows users to stress communication links and to check the functionality of error monitoring equipment along the path. 2 of 22

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8542.39.23 No ..Linear/analogue and peripheral integrated circuits, timers, voltage regulators, A/D and D/A converters, telecommunication and modem integrated circuits, other than board level products Free

Electronic integrated circuits- Processors and controllers, whether or not combined with memories, converters, logic circuits, amplifiers, clock and timing circuits, or other circuits
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